Skip to content

Everything Eddy Current

ETher NDE

News

Latest news and information from ETher NDE

ETher NDE part of winning UK Consortium for development of NDT in metal additive manufacturing

ETher NDE part of winning UK Consortium for development of NDT in metal additive manufacturing

June 2019

A consortium comprising ETher NDE (St Albans), Sonemat (Coventry), Hybrid Manufacturing Technologies (Moira), Innvotek (London), Brunel Innovation Centre (Abington) and TWI (Abington) has won a grant to develop technology to inspect metal additive manufactured parts during the manufacturing process. The technology uses electromagnetic methods (electromagnetic acoustic transducer (EMAT) and eddy current (EC)) to detect defects and to monitor residual stress in additive manufacturing (AM) and is abbreviated as EM-ReSt.

Read More...

Making MFL tube inspection easier than ever…. The new SteelCheck - compact, portable and fast.

Making MFL tube inspection easier than ever…. The new SteelCheck -  compact, portable and fast.

February 2019

ETher NDE are proud to officially release the latest addition to their Eddy Current Flaw Detector range - the SteelCheck. Building on the success of ETher’s NDT product development, the SteelCheck has been designed to bring to the market the most compact dedicated MFL instrument for testing carbon steel tubes and plates.

Read More...

ETher NDE win UK Ministry of Defence Contract

ETher NDE win UK Ministry of Defence Contract

June 2016

ETher NDE is delighted to announce that they have successfully secured an Order from the UK Ministry of Defence (MoD) to supply almost two hundred Eddy Current Flaw Detectors, which will be deployed worldwide.

Read More...

Successful delivery of the first VeeScans

Successful delivery of the first VeeScans

July 2015

The VeeScan Eddy Current Aircraft Wheel Inspection Systems are a key part of the ETher NDE range. Designed by the team behind the Hocking Wheelscan 5, the VeeScan has the pedigree of expert engineering expected within the industry.

Read More...